• DocumentCode
    399017
  • Title

    A novel technique to determine second-order optical nonlinearity profiles

  • Author

    Ozcan, Aydogan ; Digonnet, Michel

  • Author_Institution
    Edward L. Ginzton Lab., Stanford Univ., CA, USA
  • fYear
    2003
  • fDate
    23-28 March 2003
  • Firstpage
    524
  • Abstract
    We report a novel technique to determine uniquely the second-order nonlinearity profile of nonlinear films. Applied to a thermally poled silica sample, it reveals a stronger coefficient d33 (0.8 pm/V) than previously reported and important new profile features. Thermal poling is an interesting and potentially important technique used to induce a second-order optical nonlinearity in silica. This new and powerful technique is predicted to measure the nonlinearity and the nonlinearity profile of poled glasses and other nonlinear films.
  • Keywords
    dielectric polarisation; electro-optical devices; nonlinear optics; optical harmonic generation; silicon compounds; SiO2; nonlinear films; poled glasses; second-order nonlinearity profile; thermally poled silica; Fiber nonlinear optics; Monitoring; Nonlinear optics; Optical fiber filters; Optical films; Optical filters; Packaging; Phase measurement; Silicon compounds; Thin film devices;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Optical Fiber Communications Conference, 2003. OFC 2003
  • Print_ISBN
    1-55752-746-6
  • Type

    conf

  • DOI
    10.1109/OFC.2003.1248385
  • Filename
    1248385
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=399017