DocumentCode
399518
Title
Electrodynamic characteristics of the multilayered semiconductor-dielectric structure with diffraction grating
Author
Abdulkadyrov, V.A. ; Khutoryan, E.M.
Author_Institution
Usikov Inst. for Radiophys. & Electron., NASU, Kharkov, Ukraine
fYear
2003
fDate
23-25 Sept. 2003
Firstpage
35
Lastpage
38
Abstract
The interaction of electromagnetic plane wave with multilayered semiconductor-dielectric structure with diffraction grating is studied. The algebraic set of equations of Fredholm type of second kind has been obtained. The reflection coefficient is numerically determined. It is shown that it can be less than unity (wave amplification) as well as less than unity (wave absorption).
Keywords
dielectric materials; diffraction gratings; electrodynamics; electromagnetic wave absorption; electromagnetic wave reflection; multilayers; semiconductor materials; Fredholm type equations; algebraic equation set; diffraction grating; electrodynamic characteristics; electromagnetic plane wave; multilayered semiconductor-dielectric structure; reflection coefficient; wave absorption; wave amplification;
fLanguage
English
Publisher
ieee
Conference_Titel
Direct and Inverse Problems of Electromagnetic and Acoustic Wave Theory, 2003. DIPED 2003. Proceedings of 8th International Seminar/Workshop on
Conference_Location
Lviv, Ukraine
Print_ISBN
966-02-2888-0
Type
conf
Filename
1249792
Link To Document