Title :
BIST based fault diagnosis using ambiguous test set
Author :
Takahashi, Hiroshi ; Tsugaoka, Yasunori ; Ayano, Hidekazu ; Takamatsu, Yuzo
Author_Institution :
Dept. of Comput. Sci., Ehime Univ., Matsuyama, Japan
Abstract :
We propose a method for diagnosing single stuck-at faults under a built-in self-test (BIST) environment. Under the BIST environment, it is difficult to determine which BIST vectors produced errors due to the high degree of test response compaction. Therefore the detecting test set that is determined in BIST session includes non-detecting tests. We call the detecting test set determined after BIST session an "ambiguous diagnostic test set". Firstly, we propose a method for identifying candidate faults based on the ambiguous diagnostic test set. Moreover we propose a method for identifying candidate non-detecting tests that belong to the ambiguous diagnostic test set. Diagnosis by using more accurate diagnostic test sets is able to improve the diagnostic ambiguity.
Keywords :
VLSI; built-in self test; failure analysis; fault diagnosis; integrated circuit reliability; integrated circuit testing; BIST based fault diagnosis; BIST environment; BIST vectors; ambiguous diagnostic test set; ambiguous test set; candidate fault identification; detecting test set; nondetecting tests; single stuck-at faults; test response compaction; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Compaction; Dictionaries; Fault detection; Fault diagnosis; System testing; Very large scale integration;
Conference_Titel :
Defect and Fault Tolerance in VLSI Systems, 2003. Proceedings. 18th IEEE International Symposium on
Print_ISBN :
0-7695-2042-1
DOI :
10.1109/DFTVS.2003.1250099
