BIST based fault diagnosis using ambiguous test set

Author

Takahashi, Hiroshi ; Tsugaoka, Yasunori ; Ayano, Hidekazu ; Takamatsu, Yuzo

Author_Institution

Dept. of Comput. Sci., Ehime Univ., Matsuyama, Japan

fYear

2003

fDate

3-5 Nov. 2003

Firstpage

89

Lastpage

96

Abstract

We propose a method for diagnosing single stuck-at faults under a built-in self-test (BIST) environment. Under the BIST environment, it is difficult to determine which BIST vectors produced errors due to the high degree of test response compaction. Therefore the detecting test set that is determined in BIST session includes non-detecting tests. We call the detecting test set determined after BIST session an "ambiguous diagnostic test set". Firstly, we propose a method for identifying candidate faults based on the ambiguous diagnostic test set. Moreover we propose a method for identifying candidate non-detecting tests that belong to the ambiguous diagnostic test set. Diagnosis by using more accurate diagnostic test sets is able to improve the diagnostic ambiguity.

Keywords

VLSI; built-in self test; failure analysis; fault diagnosis; integrated circuit reliability; integrated circuit testing; BIST based fault diagnosis; BIST environment; BIST vectors; ambiguous diagnostic test set; ambiguous test set; candidate fault identification; detecting test set; nondetecting tests; single stuck-at faults; test response compaction; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Compaction; Dictionaries; Fault detection; Fault diagnosis; System testing; Very large scale integration;

fLanguage

English

Publisher

ieee

Conference_Titel

Defect and Fault Tolerance in VLSI Systems, 2003. Proceedings. 18th IEEE International Symposium on

ISSN

1550-5774

Print_ISBN

0-7695-2042-1

Type

conf

DOI

10.1109/DFTVS.2003.1250099

Filename

1250099