Title :
Detecting and locating faults in VLSI implementations of the Advanced Encryption Standard
Author :
Bertoni, Guido ; Breveglieri, Luca ; Koren, Israel ; Maistri, Paolo ; Piuri, Vincenzo
Author_Institution :
Dept. of Electron. & Inf. Technol., Politecnico di Milano, Italy
Abstract :
Concurrent fault detection for hardware implementations of the Advanced Encryption Standard (AES) may provide protection against random faults, and against an attacker who may maliciously inject faults in order to find the encryption secret key. We have recently developed such a scheme which is based on the parity code. In this paper we prove that the parity-based code detects all odd-order faults and allows the location of most single transient and permanent faults.
Keywords :
VLSI; cryptography; fault location; integrated circuit modelling; integrated circuit reliability; integrated circuit testing; parity check codes; telecommunication security; telecommunication standards; AES; Advanced Encryption Standard; VLSI implementations; concurrent fault detection; encryption secret key; fault injection; fault location; hardware implementations; odd-order faults; parity code; permanent faults; random fault protection; single transient faults; Cryptography; Fault detection; Fault tolerant systems; Very large scale integration;
Conference_Titel :
Defect and Fault Tolerance in VLSI Systems, 2003. Proceedings. 18th IEEE International Symposium on
Print_ISBN :
0-7695-2042-1
DOI :
10.1109/DFTVS.2003.1250101
