DocumentCode :
399567
Title :
Function-based dynamic compaction and its impact on test set sizes
Author :
Wingfield, James ; Dworak, Jennifer ; Mercer, M. Ray
Author_Institution :
Texas A&M Univ., College Station, TX, USA
fYear :
2003
fDate :
3-5 Nov. 2003
Firstpage :
167
Lastpage :
174
Abstract :
Due to the limited amount of available resources and time used for manufacture testing of integrated circuits, there is great interest in minimizing the number of test patterns applied while maintaining a large number of defect detections. Many methods have been developed to generate compact test pattern sets, and this paper extends the concepts of one such method (pattern-based dynamic compaction) into the functional realm. We will show that function-based dynamic compaction yields very compact test sets, and it retains compact performance for fault models of different difficulty.
Keywords :
automatic test pattern generation; fault location; integrated circuit modelling; integrated circuit testing; minimisation; production testing; compact test pattern sets; defect detections; fault model difficulty; function-based dynamic compaction; integrated circuits; manufacture testing; pattern-based dynamic compaction; test pattern minimization; test resources; test set sizes; test time; Circuit faults; Circuit simulation; Circuit testing; Compaction; Electrical fault detection; Fault detection; Integrated circuit manufacture; Integrated circuit testing; Manufacturing processes; Test pattern generators;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Defect and Fault Tolerance in VLSI Systems, 2003. Proceedings. 18th IEEE International Symposium on
ISSN :
1550-5774
Print_ISBN :
0-7695-2042-1
Type :
conf
DOI :
10.1109/DFTVS.2003.1250109
Filename :
1250109
Link To Document :
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