• DocumentCode
    399571
  • Title

    Fault tolerant Hopfield associative memory on torus

  • Author

    Ayoubi, R.A. ; Ziade, H.A. ; Bayoumi, M.A.

  • Author_Institution
    Dept. of Comput. Eng., Univ. of Balamand, Tripoli, Lebanon
  • fYear
    2003
  • fDate
    3-5 Nov. 2003
  • Firstpage
    369
  • Lastpage
    376
  • Abstract
    The associative Hopfield memory, is a very useful artificial neural network (ANN) that can be utilized in numerous applications. Examples include, pattern recognition, noise removal, information retrieval, and combinatorial optimization problems. This paper provides an efficient and fault tolerant algorithm for implementing the Hopfield ANN on a torus parallel architecture. The main advantage of this algorithm is fault tolerance, high performance, and cost effectiveness. The developed algorithm is much faster than other known algorithms of its class and comparable in speed to more complex architectures such as the hypercube without the added cost. It requires O(1) multiplications and O(log N) additions, whereas most others require O(N) multiplications and O(N) additions. Moreover, the developed algorithm has an added advantage over other known algorithms due to its fault tolerance feature, which is based on ABFT techniques. The main advantage of our ABFT (algorithm-based fault tolerance) method over other existing ABFT methods is its ability to detect and correct several faults without any additional hardware overhead (i.e. no extra row or column is needed).
  • Keywords
    Hopfield neural nets; content-addressable storage; digital arithmetic; fault tolerance; parallel architectures; ABFT techniques; Hopfield associative memory; addition; algorithm-based fault tolerance; artificial neural network; fault correction; fault detection; fault tolerance; fault tolerant ANN; hypercube; multiplication; torus parallel architecture; Artificial neural networks; Associative memory; Costs; Fault detection; Fault tolerance; Hardware; Hypercubes; Information retrieval; Parallel architectures; Pattern recognition;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Defect and Fault Tolerance in VLSI Systems, 2003. Proceedings. 18th IEEE International Symposium on
  • ISSN
    1550-5774
  • Print_ISBN
    0-7695-2042-1
  • Type

    conf

  • DOI
    10.1109/DFTVS.2003.1250133
  • Filename
    1250133