DocumentCode :
399575
Title :
Dependability analysis of CAN networks: an emulation-based approach
Author :
Pérez, J. ; Reorda, M. Sonza ; Violante, M.
Author_Institution :
Fac. de Ingenieria, Univ. de la Republica, Montevideo, Uruguay
fYear :
2003
fDate :
3-5 Nov. 2003
Firstpage :
537
Lastpage :
544
Abstract :
Today many safety-critical applications are based on distributed systems where several computing nodes exchange information via suitable network interconnections. An example of this class of applications is the automotive field, where developers are exploiting the CAN protocol for implementing the communication backbone. The capability of accurately evaluating the dependability properties of such a kind of systems is today a major concern. In this paper we present a new environment that can be fruitfully exploited to assess the effects of faults in CAN-based networks. The entire network is emulated via an ad-hoc hardware/software system that allows easily evaluating the effects of faults in all the network components, namely the network nodes, the protocol controllers and the transmission channel. In this paper, we report a detailed description of the environment we set-up and we present some preliminary results we gathered to assess the soundness of the proposed approach.
Keywords :
automotive electronics; controller area networks; distributed processing; interconnected systems; safety systems; telecommunication network reliability; CAN network dependability analysis; CAN protocol; ad-hoc hardware/software system; automotive communication backbone; computing nodes; distributed computing systems; network emulation environment; network interconnections; protocol controllers; safety-critical applications; transmission channel; Application software; Automotive engineering; Computer networks; Control systems; Distributed computing; Hardware; Protocols; Software systems; Spine; Vehicles;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Defect and Fault Tolerance in VLSI Systems, 2003. Proceedings. 18th IEEE International Symposium on
ISSN :
1550-5774
Print_ISBN :
0-7695-2042-1
Type :
conf
DOI :
10.1109/DFTVS.2003.1250153
Filename :
1250153
Link To Document :
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