• DocumentCode
    399575
  • Title

    Dependability analysis of CAN networks: an emulation-based approach

  • Author

    Pérez, J. ; Reorda, M. Sonza ; Violante, M.

  • Author_Institution
    Fac. de Ingenieria, Univ. de la Republica, Montevideo, Uruguay
  • fYear
    2003
  • fDate
    3-5 Nov. 2003
  • Firstpage
    537
  • Lastpage
    544
  • Abstract
    Today many safety-critical applications are based on distributed systems where several computing nodes exchange information via suitable network interconnections. An example of this class of applications is the automotive field, where developers are exploiting the CAN protocol for implementing the communication backbone. The capability of accurately evaluating the dependability properties of such a kind of systems is today a major concern. In this paper we present a new environment that can be fruitfully exploited to assess the effects of faults in CAN-based networks. The entire network is emulated via an ad-hoc hardware/software system that allows easily evaluating the effects of faults in all the network components, namely the network nodes, the protocol controllers and the transmission channel. In this paper, we report a detailed description of the environment we set-up and we present some preliminary results we gathered to assess the soundness of the proposed approach.
  • Keywords
    automotive electronics; controller area networks; distributed processing; interconnected systems; safety systems; telecommunication network reliability; CAN network dependability analysis; CAN protocol; ad-hoc hardware/software system; automotive communication backbone; computing nodes; distributed computing systems; network emulation environment; network interconnections; protocol controllers; safety-critical applications; transmission channel; Application software; Automotive engineering; Computer networks; Control systems; Distributed computing; Hardware; Protocols; Software systems; Spine; Vehicles;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Defect and Fault Tolerance in VLSI Systems, 2003. Proceedings. 18th IEEE International Symposium on
  • ISSN
    1550-5774
  • Print_ISBN
    0-7695-2042-1
  • Type

    conf

  • DOI
    10.1109/DFTVS.2003.1250153
  • Filename
    1250153