• DocumentCode
    399839
  • Title

    Detailed structure of harmonic signals in modulation spectroscopy and resulting precision improvement in non-intrusive laser based sensors

  • Author

    Khan, M.A. ; Barrington, J.M. ; Dharamsi, A.N.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Old Dominion Univ., Norfolk, VA, USA
  • Volume
    1
  • fYear
    2003
  • fDate
    27-28 Oct. 2003
  • Firstpage
    25
  • Abstract
    This paper presents a statistical analysis method to quantify the quality of fits between experimental and theoretical results, in a manner that illustrates the salient aspects of wavelength modulation spectroscopy (WMS), with higher harmonic detection. Variations in the signal characteristics, as a result of changes such as linewidths, lineshape profiles etc., in the underlying transition are analyzed. The analysis is based on calculations of variance of errors between experimental data points and theoretical models. A higher magnitude in such a variance is a consequence of larger scatter in errors across the wavelength regions of interest. It is seen that the greater structure of the higher harmonic signals generally gives a larger variance of these mismatches. This then leads to the tighter constraints, effectively resulting in a better fit and hence in a higher precision measurement.
  • Keywords
    electro-optical modulation; frequency modulation; laser beam applications; modulation spectroscopy; optical sensors; optical signal detection; spectral line breadth; statistical analysis; visible spectra; error variance; harmonic detection; harmonic signals; lineshape profiles; linewidths; nonintrusive laser based sensors; precision measurement; statistical analysis; wavelength modulation spectroscopy; Absorption; Constraint theory; Electric variables measurement; Frequency modulation; Phase detection; Probes; Signal detection; Spectroscopy; Turning; Wavelength measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics Society, 2003. LEOS 2003. The 16th Annual Meeting of the IEEE
  • ISSN
    1092-8081
  • Print_ISBN
    0-7803-7888-1
  • Type

    conf

  • DOI
    10.1109/LEOS.2003.1251582
  • Filename
    1251582