DocumentCode
399847
Title
Temperature sensitivity of 1360 nm InGaAsN quantum well lasers
Author
Yeh, Jeng-Ya ; Tansu, Nelson ; Mawst, Luke J.
Author_Institution
Dept. of Electr. & Comput. Eng., Wisconsin Univ., Madison, WI, USA
Volume
1
fYear
2003
fDate
27-28 Oct. 2003
Firstpage
41
Abstract
This study demonstrated that the nitrogen content in the quantum well (QW) dramatically affects the temperature sensitivity of current injection efficiency and material gain parameter. The current injection efficiency of InGaAsN QW lasers with increasing N-content exhibits increasing temperature sensitivity, which could result from the reduction of the heavy hole confinement. Suppression of thermionic carrier leakage is crucial to realizing high-performance InGaAsN QW lasers with high N-content for emission wavelength beyond 1360-nm or even up to 1550-nm.
Keywords
III-V semiconductors; gallium arsenide; indium compounds; nitrogen; quantum well lasers; thermo-optical effects; 1360 nm; InGaAsN; current injection efficiency; heavy hole confinement; material gain parameter; nitrogen; quantum well; quantum well lasers; temperature sensitivity; thermionic carrier leakage; Current density; Electrons; Heat sinks; Indium gallium arsenide; Nitrogen; Optical materials; Quantum well lasers; Radiative recombination; Temperature sensors; Thermionic emission;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics Society, 2003. LEOS 2003. The 16th Annual Meeting of the IEEE
ISSN
1092-8081
Print_ISBN
0-7803-7888-1
Type
conf
DOI
10.1109/LEOS.2003.1251590
Filename
1251590
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