• DocumentCode
    399847
  • Title

    Temperature sensitivity of 1360 nm InGaAsN quantum well lasers

  • Author

    Yeh, Jeng-Ya ; Tansu, Nelson ; Mawst, Luke J.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Wisconsin Univ., Madison, WI, USA
  • Volume
    1
  • fYear
    2003
  • fDate
    27-28 Oct. 2003
  • Firstpage
    41
  • Abstract
    This study demonstrated that the nitrogen content in the quantum well (QW) dramatically affects the temperature sensitivity of current injection efficiency and material gain parameter. The current injection efficiency of InGaAsN QW lasers with increasing N-content exhibits increasing temperature sensitivity, which could result from the reduction of the heavy hole confinement. Suppression of thermionic carrier leakage is crucial to realizing high-performance InGaAsN QW lasers with high N-content for emission wavelength beyond 1360-nm or even up to 1550-nm.
  • Keywords
    III-V semiconductors; gallium arsenide; indium compounds; nitrogen; quantum well lasers; thermo-optical effects; 1360 nm; InGaAsN; current injection efficiency; heavy hole confinement; material gain parameter; nitrogen; quantum well; quantum well lasers; temperature sensitivity; thermionic carrier leakage; Current density; Electrons; Heat sinks; Indium gallium arsenide; Nitrogen; Optical materials; Quantum well lasers; Radiative recombination; Temperature sensors; Thermionic emission;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics Society, 2003. LEOS 2003. The 16th Annual Meeting of the IEEE
  • ISSN
    1092-8081
  • Print_ISBN
    0-7803-7888-1
  • Type

    conf

  • DOI
    10.1109/LEOS.2003.1251590
  • Filename
    1251590