Correction of the first-order errors produced by polarizing devices by means of the Mueller-coherence matrix for polarimetric measurements

Author

Cubián, D. Pereda ; Diego, J. L Arce ; Rentmeesters, R. ; Obregón, C. Iturregui

Author_Institution

TEISA Dept., Cantabria Univ., Santander, Spain

Volume

1

fYear

2003

fDate

27-28 Oct. 2003

Firstpage

101

Abstract

A method is presented to calculate the exact Mueller matrix starting from the slightly erroneous measured values. The correction of the measured Mueller matrix is realized considering the first-order errors introduced by the polarizing devices, and using the SU(4)-O+(6) homomorphism to find the Mueller matrices of the non-ideal devices. A practical example is used to illustrate the method and the variation produced in the matrix elements. The method can be useful in any polarimetric technique.

Keywords

error correction; matrix algebra; measurement errors; polarimetry; Mueller-coherence matrix; SU(4)-O+(6) homomorphism; first-order error correction; polarimetric measurements; polarizing devices; Error correction; Information analysis; Information technology; Matrix converters; Optical attenuators; Optical devices; Optical polarization; Optical retarders; Performance analysis; Strain measurement;

fLanguage

English

Publisher

ieee

Conference_Titel

Lasers and Electro-Optics Society, 2003. LEOS 2003. The 16th Annual Meeting of the IEEE

ISSN

1092-8081

Print_ISBN

0-7803-7888-1

Type

conf

DOI

10.1109/LEOS.2003.1251620

Filename

1251620