DocumentCode
399976
Title
Accurate semi-empirical model for annealed proton exchanged waveguides in z-cut lithium niobate
Author
Roussev, Rostislav ; Xiuping Xie ; Parameswaran, K. ; Fejer, M.M.
Author_Institution
Dept. of Appl. Phys., Stanford Univ., CA, USA
Volume
1
fYear
2003
fDate
27-28 Oct. 2003
Firstpage
338
Abstract
This study develops an accurate method to estimate the proton dose after proton exchange (PE) by applying a soft anneal step, typically 10-30 hours at 210°C, which solves the problems of instability and multi-phase composition of PE waveguides. The soft anneal process slows down with time and practically self-terminates once the refractive index step at 633 nm drops below 0.105, corresponding to a concentration x = 0.44 in the film HxLi1-xNbO3. Proton dose estimate after soft anneal can be done with 0.25 to 0.5% precision by prism coupling measurements allowing control of the waveguide nonlinear optical frequency converters (WNOFC) quasi-phase-matching (QPM) wavelength with 0.5-1 nm accuracy.
Keywords
annealing; ion exchange; lithium compounds; optical fabrication; optical frequency conversion; optical phase matching; optical planar waveguides; refractive index; 10 to 30 hour; 210 degC; 633 nm; HxLi1-xNbO3; instability; multiphase composition; prism coupling measurements; proton dose; proton exchanged waveguides; quasiphase-matching; refractive index; semiempirical model; soft anneal process; waveguide nonlinear optical frequency converters; z-cut lithium niobate; Annealing; Frequency conversion; Frequency estimation; Lithium niobate; Niobium compounds; Optical coupling; Optical films; Optical waveguides; Protons; Refractive index;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics Society, 2003. LEOS 2003. The 16th Annual Meeting of the IEEE
ISSN
1092-8081
Print_ISBN
0-7803-7888-1
Type
conf
DOI
10.1109/LEOS.2003.1251783
Filename
1251783
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