DocumentCode
400354
Title
A superconducting single-photon detector for CMOS IC probing
Author
Zhang, J. ; Pearlman, A. ; Slysz, W. ; Verevkin, A. ; Sobolewski, Roman ; Wilsher, K. ; Lo, W. ; Okunev, O. ; Korneev, Alexander ; Kouminov, P. ; Chulkova, G. ; Gol´tsman, Gregory N.
Author_Institution
Rochester Univ., NY, USA
Volume
2
fYear
2003
fDate
27-28 Oct. 2003
Firstpage
602
Abstract
In this paper, a novel, time-resolved, NbN-based, superconducting single-photon detector (SSPD) has been developed for probing CMOS integrated circuits (ICs) using photon emission timing analysis (PETA).
Keywords
CMOS integrated circuits; infrared spectra; niobium compounds; photoemission; superconducting photodetectors; time resolved spectra; timing jitter; CMOS IC probing; NbN; complementary metal-oxide-semiconductor integrated circuit probing; photon emission timing analysis; time-resolved superconducting single-photon detector; CMOS integrated circuits; Circuit testing; Detectors; High speed optical techniques; Histograms; Photonic integrated circuits; Superconducting integrated circuits; Temperature; Timing jitter; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics Society, 2003. LEOS 2003. The 16th Annual Meeting of the IEEE
ISSN
1092-8081
Print_ISBN
0-7803-7888-1
Type
conf
DOI
10.1109/LEOS.2003.1252944
Filename
1252944
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