• DocumentCode
    400354
  • Title

    A superconducting single-photon detector for CMOS IC probing

  • Author

    Zhang, J. ; Pearlman, A. ; Slysz, W. ; Verevkin, A. ; Sobolewski, Roman ; Wilsher, K. ; Lo, W. ; Okunev, O. ; Korneev, Alexander ; Kouminov, P. ; Chulkova, G. ; Gol´tsman, Gregory N.

  • Author_Institution
    Rochester Univ., NY, USA
  • Volume
    2
  • fYear
    2003
  • fDate
    27-28 Oct. 2003
  • Firstpage
    602
  • Abstract
    In this paper, a novel, time-resolved, NbN-based, superconducting single-photon detector (SSPD) has been developed for probing CMOS integrated circuits (ICs) using photon emission timing analysis (PETA).
  • Keywords
    CMOS integrated circuits; infrared spectra; niobium compounds; photoemission; superconducting photodetectors; time resolved spectra; timing jitter; CMOS IC probing; NbN; complementary metal-oxide-semiconductor integrated circuit probing; photon emission timing analysis; time-resolved superconducting single-photon detector; CMOS integrated circuits; Circuit testing; Detectors; High speed optical techniques; Histograms; Photonic integrated circuits; Superconducting integrated circuits; Temperature; Timing jitter; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics Society, 2003. LEOS 2003. The 16th Annual Meeting of the IEEE
  • ISSN
    1092-8081
  • Print_ISBN
    0-7803-7888-1
  • Type

    conf

  • DOI
    10.1109/LEOS.2003.1252944
  • Filename
    1252944