Combined FDTD/macromodel simulation of interconnected digital devices

Author

Grivet-Talocia, S. ; Stievano, I.S. ; Maio, I.A. ; Canavero, F.G.

Author_Institution

Dipt. Elettronica, Politecnico di Torino, Italy

fYear

2003

fDate

2003

Firstpage

536

Lastpage

541

Abstract

Behavioral models of digital devices based on Radial Basis Functions (RBF) are incorporated into a Finite-Difference Time-Domain (FDTD) solver for full-wave analysis of interconnected drivers and receivers. This modeling strategy allows a very accurate and efficient full-wave solution of interconnection structures with possibly complex geometry including the nonlinear and dynamic effects of real-world digital devices, without the need of detailed transistor-level models. Examples of signal integrity and field coupling analysis are shown.

Keywords

digital integrated circuits; finite difference time-domain analysis; integrated circuit interconnections; integrated circuit modelling; radial basis function networks; FDTD/macromodel simulation; behavioral model; driver; dynamic effects; field coupling; full-wave analysis; interconnected digital device; nonlinear effects; radial basis function; receiver; signal integrity; Analytical models; Circuit simulation; Computational modeling; Driver circuits; Electromagnetic compatibility; Finite difference methods; Geometry; Integrated circuit interconnections; Solid modeling; Time domain analysis;

fLanguage

English

Publisher

ieee

Conference_Titel

Design, Automation and Test in Europe Conference and Exhibition, 2003

ISSN

1530-1591

Print_ISBN

0-7695-1870-2

Type

conf

DOI

10.1109/DATE.2003.1253664

Filename

1253664