DocumentCode
400449
Title
From C programs to the configure-execute model
Author
Cardoso, João M P ; Weinhardt, Markus
Author_Institution
Univ. do Algarve, Faro, Portugal
fYear
2003
fDate
2003
Firstpage
576
Lastpage
581
Abstract
The emergence of run-time reconfigurable architectures makes feasible the configure-execute paradigm. Compilation of behavioral descriptions (in, e.g., C, Java, etc.), apart from mapping the computational structures onto the available resources on the device, must split the program in temporal sections if it needs more resources than physically available. In addition, since the execution of the computational structures in a configuration needs at least two stages (i.e., configuring and computing), it is important to split the program such that the reconfiguration overheads are minimized, taking advantage of the overlapping of the execution stages on different configurations. This paper presents mapping techniques to cope with those features. The techniques are being researched in the context of a C compiler for the eXtreme Processing Platform (XPP). Temporal partitioning is applied to furnish a set of configurations that reduces the reconfiguration overhead and thus may lead to performance gains. We also show that when applications include a sequence of loops, the use of several configurations may be more beneficial than the mapping of the entire application onto a single configuration. Preliminary results for a number of benchmarks strongly confirm the approach.
Keywords
C language; circuit CAD; high level synthesis; microprocessor chips; program compilers; reconfigurable architectures; C compiler; behavioral description compilation; configure-execute paradigm; extreme processing platform; mapping techniques; reconfiguration overheads; run-time reconfigurable architectures; temporal partitioning; Computer architecture; Energy consumption; Field programmable gate arrays; Hardware; Java; Paper technology; Performance gain; Physics computing; Reconfigurable architectures; Runtime;
fLanguage
English
Publisher
ieee
Conference_Titel
Design, Automation and Test in Europe Conference and Exhibition, 2003
ISSN
1530-1591
Print_ISBN
0-7695-1870-2
Type
conf
DOI
10.1109/DATE.2003.1253670
Filename
1253670
Link To Document