• DocumentCode
    400450
  • Title

    Versatile high-level synthesis of self-checking datapaths using an on-line testability metric

  • Author

    Oikonomakos, Petros ; Zwolinski, Mark ; Al-Hashimi, Bashir M.

  • Author_Institution
    Dept. of Electron. & Comput. Sci., Southampton Univ., UK
  • fYear
    2003
  • fDate
    2003
  • Firstpage
    596
  • Lastpage
    601
  • Abstract
    There have been several recent attempts to include duplication-based on-line testability in behaviourally synthesized designs. In this paper, on-line testability is considered within the optimisation process of iterative, cost function-driven high-level synthesis, such that on-line testing resources are inserted automatically without any modification of the source HDL code. This involves the introduction of a metric for on-line testability. A variation of duplication testing (namely inversion testing) is also used, providing the system with an additional degree of freedom towards minimising hardware overheads associated with test resource insertion. Considering on-line testability within the synthesis process facilitates fast and efficient design space exploration, resulting in a versatile high-level synthesis process, capable of producing alternative realisations according to the designer´s directions.
  • Keywords
    built-in self test; circuit optimisation; data flow graphs; design for testability; hardware description languages; high level synthesis; iterative methods; logic testing; HDL; cost function-driven synthesis; dataflow graphs; duplication-based on-line testability; inversion testing; iterative synthesis; on-line testability metric; optimisation; self-checking datapaths; test resource insertion; versatile high-level synthesis; Adders; Algorithm design and analysis; Automatic testing; Circuit faults; Computer science; Electronic equipment testing; Hardware design languages; High level synthesis; Redundancy; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation and Test in Europe Conference and Exhibition, 2003
  • ISSN
    1530-1591
  • Print_ISBN
    0-7695-1870-2
  • Type

    conf

  • DOI
    10.1109/DATE.2003.1253673
  • Filename
    1253673