• DocumentCode
    400451
  • Title

    Analysis and white-box modeling of weakly nonlinear time-varying circuits

  • Author

    Dobrovolný, Petr ; Vandersteen, Gerd ; Wambacq, Piet ; Donnay, Stéphane

  • Author_Institution
    IMEC, Leuven, Belgium
  • fYear
    2003
  • fDate
    2003
  • Firstpage
    624
  • Lastpage
    629
  • Abstract
    The architectural study of wireless communication systems typically requires simulations with high-level models for different analog and RF blocks. Among these blocks, frequency-translating devices such as mixers pose problems in RF circuit simulation since their response typically covers a mix of long- and short-time scales. This paper proposes a technique to analyze and model nonlinear frequency-translating RF circuits such as up- and downconversion mixers. The proposed method is based on a generalized Volterra series approach for periodically time-varying systems. It enables a multi-tone distortion analysis starting from a circuit description and derives simplified high-level models based on the most important nonlinear contributions. These models give both insight in the nonlinear behavior and enable an efficient high-level simulation during architectural design of front-ends of RF transceivers.
  • Keywords
    Volterra series; circuit simulation; high level synthesis; mixers (circuits); nonlinear distortion; nonlinear network synthesis; time-varying networks; transceivers; RF circuit simulation; RF transceiver; Volterra series; analog front-end; architectural design; downconversion mixer; frequency translating device; high-level model; multi-tone distortion; upconversion mixer; weakly nonlinear periodically time-varying circuit; white-box model; wireless communication system; Analytical models; Circuit simulation; Frequency dependence; Mathematical model; Nonlinear distortion; Radio frequency; Time varying circuits; Time varying systems; Transceivers; Wireless communication;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation and Test in Europe Conference and Exhibition, 2003
  • ISSN
    1530-1591
  • Print_ISBN
    0-7695-1870-2
  • Type

    conf

  • DOI
    10.1109/DATE.2003.1253677
  • Filename
    1253677