Title :
Rapid configuration and instruction selection for an ASIP: a case study
Author :
Cheung, Newton ; Henkel, Jörg ; Parameswaran, Sri
Author_Institution :
Sch. of Comput. Sci. & Eng., New South Wales Univ., Sydney, NSW, Australia
Abstract :
We present a methodology that maximizes the performance of Tensilica based Application Specific Instruction-set Processor (ASIP) through instruction selection when an area constraint is given. Our approach rapidly selects from a set of pre-fabricated coprocessors/functional units from our library of pre-designed specific instructions (to evaluate our technology we use the Tensilica platform). As a result, we significantly increase application performance while area constraints are satisfied. Our methodology uses a combination of simulation, estimation and a pre-characterised library of instructions, to select the appropriate co-processors and instructions. We report that by selecting the appropriate coprocessors/functional units and specific TIE instructions, the total execution time of complex applications (we study a voice encoder/decoder), an application´s performance can be reduced by up to 85% compared to the base implementation. Our estimator used in the system takes typically less than a second to estimate, with an average error rate of 4% (as compared to full simulation, which takes 45 minutes). The total selection process using our methodology takes 3-4 hours, while a full design space exploration using simulation would take several days.
Keywords :
application specific integrated circuits; coprocessors; instruction sets; integrated circuit design; 3 to 4 h; ASIP; Tensilica platform; area constraint; area constraints; co-processors; error rate; execution time; instruction selection; pre-designed specific instructions; rapid configuration; Application specific processors; Architecture description languages; Computer aided software engineering; Computer science; Coprocessors; Flow graphs; Libraries; Process design; Space exploration; Time to market;
Conference_Titel :
Design, Automation and Test in Europe Conference and Exhibition, 2003
Print_ISBN :
0-7695-1870-2
DOI :
10.1109/DATE.2003.1253705