• DocumentCode
    400684
  • Title

    Weibull based analytical waveform model

  • Author

    Amin, Chirayu S. ; Dartu, Florentin ; Ismail, Y.I.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Northwestern Univ., Evanston, IL, USA
  • fYear
    2003
  • fDate
    9-13 Nov. 2003
  • Firstpage
    161
  • Lastpage
    168
  • Abstract
    Current CMOS technologies are characterized by interconnect lines with increased relative resistance w.r.t. driver output resistance. Designs generate signal waveshapes that are very difficult to model using a single parameter model such as the transition time. In this paper, we present a simple and robust two-parameter analytical expression for waveform modeling based on the Weibull cumulative distribution function. The Weibull model accurately captures the variety of waveshapes without introducing significant runtime overhead and produces results with less than 5% error. We also present a fast and simple algorithm to convert waveforms obtained by circuit simulation to the Weibull model. A methodology for characterizing gates for the new model is also presented. Simulation results for many single and multiple input gates show errors well below 5%. Our model can be used in a mixed environment where some signals may still be characterized by a single parameter.
  • Keywords
    CMOS integrated circuits; Weibull distribution; circuit simulation; CMOS technologies; Weibull based analytical waveform model; Weibull cumulative distribution function; circuit simulation; driver output resistance; multiple input gates; signal waveshapes; single input gates; single parameter model; transition time; two parameter analytical expression; waveform modeling; Analytical models; CMOS technology; Circuit simulation; Distribution functions; Integrated circuit interconnections; Robustness; Runtime; Semiconductor device modeling; Signal design; Signal generators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Aided Design, 2003. ICCAD-2003. International Conference on
  • Conference_Location
    San Jose, CA, USA
  • Print_ISBN
    1-58113-762-1
  • Type

    conf

  • DOI
    10.1109/ICCAD.2003.159686
  • Filename
    1257625