Title :
LRU-SEQ: a novel replacement policy for transition energy reduction in instruction caches
Author :
Kalla, Praveen ; Hu, Xiaobo Sharon ; Henkel, Jörg
Author_Institution :
Dept. of Comput. Sci. & Eng., Notre Dame Univ., IN, USA
Abstract :
Leakage energy will be the major energy consumer in future deep sub-micron designs. Especially the memory sub-system of future SOCs will be negatively affected by this trend. In order to reduce the leakage energy, memory banks are transitioned to a low-energy state when possible. This transition itself costs some energy which is termed as the transition energy. In this paper we present, as the first approach of its kind, a novel energy saving replacement policy called LRU-SEQ for instruction caches. Evaluation of the policy on various architectures in a system-level environment has shown that up to 23% energy savings can be obtained. Considering the negligible hardware impact, LRU-SEQ offers a viable choice for an energy saving policy.
Keywords :
cache storage; leakage currents; system-on-chip; LRU-SEQ; SOC; energy saving replacement policy; instruction caches; leakage energy; low-energy state; memory banks; memory subsystem; system level environment; system-on-chip; transition energy reduction; Circuits; Costs; Energy consumption; Hardware; Laboratories; National electric code; Silicon; Switches; Threshold voltage; Voltage control;
Conference_Titel :
Computer Aided Design, 2003. ICCAD-2003. International Conference on
Conference_Location :
San Jose, CA, USA
Print_ISBN :
1-58113-762-1
DOI :
10.1109/ICCAD.2003.159733