• DocumentCode
    400949
  • Title

    Evolution of the local Fe environment in high temperature implanted InP

  • Author

    Gasparotto, A. ; Cesca, T. ; Mattei, G. ; Rampazzo, V. ; Priolo, Francesco ; Moreira, Edmilson C. ; Bocchi, C. ; Fraboni, B. ; Boscherini, F. ; Ciatto, G. ; D´Acapito, F.

  • fYear
    2002
  • fDate
    27-27 Sept. 2002
  • Firstpage
    657
  • Lastpage
    660
  • Abstract
    High temperature ion implantation of Fe in InP has been investigated to understand how the final lattice position of iron atoms is influenced by the implantation and annealing conditions. A high degree of substitutionality is obtained thanks to dynamical annealing, during implantation, of the damage. It is found that point defect fluxes during high temperature annealing control the kick-out of Fe from substitutional sites, leading to the formation of Fe-P complexes. However, the electrically active Fe fraction is still in the 1018 cm-3 range, and full compensation of initially n+ doped materials can be obtained.
  • Keywords
    III-V semiconductors; annealing; doping profiles; indium compounds; interstitials; ion implantation; iron; semiconductor doping; InP:Fe; annealing conditions; dynamical annealing; final lattice position; high temperature implanted InP; implantation conditions; local Fe environment; point defect fluxes; Annealing; Atom optics; Impurities; Indium phosphide; Ion implantation; Iron; Lattices; Physics; Substrates; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Ion Implantation Technology. 2002. Proceedings of the 14th International Conference on
  • Conference_Location
    Taos, New Mexico, USA
  • Print_ISBN
    0-7803-7155-0
  • Type

    conf

  • DOI
    10.1109/IIT.2002.1258091
  • Filename
    1258091