DocumentCode
400949
Title
Evolution of the local Fe environment in high temperature implanted InP
Author
Gasparotto, A. ; Cesca, T. ; Mattei, G. ; Rampazzo, V. ; Priolo, Francesco ; Moreira, Edmilson C. ; Bocchi, C. ; Fraboni, B. ; Boscherini, F. ; Ciatto, G. ; D´Acapito, F.
fYear
2002
fDate
27-27 Sept. 2002
Firstpage
657
Lastpage
660
Abstract
High temperature ion implantation of Fe in InP has been investigated to understand how the final lattice position of iron atoms is influenced by the implantation and annealing conditions. A high degree of substitutionality is obtained thanks to dynamical annealing, during implantation, of the damage. It is found that point defect fluxes during high temperature annealing control the kick-out of Fe from substitutional sites, leading to the formation of Fe-P complexes. However, the electrically active Fe fraction is still in the 1018 cm-3 range, and full compensation of initially n+ doped materials can be obtained.
Keywords
III-V semiconductors; annealing; doping profiles; indium compounds; interstitials; ion implantation; iron; semiconductor doping; InP:Fe; annealing conditions; dynamical annealing; final lattice position; high temperature implanted InP; implantation conditions; local Fe environment; point defect fluxes; Annealing; Atom optics; Impurities; Indium phosphide; Ion implantation; Iron; Lattices; Physics; Substrates; Temperature;
fLanguage
English
Publisher
ieee
Conference_Titel
Ion Implantation Technology. 2002. Proceedings of the 14th International Conference on
Conference_Location
Taos, New Mexico, USA
Print_ISBN
0-7803-7155-0
Type
conf
DOI
10.1109/IIT.2002.1258091
Filename
1258091
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