DocumentCode :
4014
Title :
Compact Design of Low Power Standard Ternary Inverter Based on OFF-State Current Mechanism Using Nano-CMOS Technology
Author :
Sunhae Shin ; Jang, Esan ; Jae Won Jeong ; Byung-Gook Park ; Kyung Rok Kim
Author_Institution :
Sch. of Electr. & Comput. Eng., Ulsan Nat. Inst. of Sci. & Technol., Ulsan, South Korea
Volume :
62
Issue :
8
fYear :
2015
fDate :
Aug. 2015
Firstpage :
2396
Lastpage :
2403
Abstract :
We propose a novel standard ternary inverter (STI) based on nanoscale CMOS technology for a compact design of multivalued logic. Using the gate bias independent OFF-state mechanisms of junction band-to-band tunneling (BTBT), tristate STI operation has been demonstrated in the conventional binary CMOS inverter by TCAD device and mixed-mode circuit simulation with 32-nm high-κ/metal-gate technology. Through analytical device modeling on BTBT and subthreshold current, static noise margin (SNM), off-leakage variation (OLV), and operation voltage (VDD) scaling limits of STI have been investigated. The typical SNM is 200 mV and the variability of the intermediate level (ΔVOM~ 50 mV) from OLV can be allowable into the worst SNM (>100 mV) of STI operation at VDD = 1 V. Exponentially reduced BTBT off-leakage around minimum VDD ~ 0.1 V is promising for ultimate low-power application of our STI.
Keywords :
CMOS logic circuits; circuit simulation; integrated circuit modelling; invertors; logic design; low-power electronics; multivalued logic; tunnelling; TCAD device; analytical device modeling; conventional binary CMOS inverter; gate bias independent OFF-state mechanisms; high-k/metal-gate technology; junction band-to-band tunneling; low power standard ternary inverter; mixed-mode circuit simulation; multivalued logic; nanoscale CMOS technology; off-leakage variation; operation voltage scaling limits; size 32 nm; static noise margin; subthreshold current; tristate STI operation; voltage 1 V; voltage 200 mV; Analytical models; CMOS integrated circuits; CMOS technology; Inverters; Logic gates; Semiconductor device modeling; Band-to-band tunneling (BTBT); CMOS technology; low-power; multivalued logic; noise margin; off-leakage variation (OLV); standard ternary inverter (STI); standard ternary inverter (STI).;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/TED.2015.2445823
Filename :
7150399
Link To Document :
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