• DocumentCode
    40151
  • Title

    Magnetism of L1_{0}{\\rm Fe}_{50-{\\rm x}}{\\rm Co}_{\\rm x}{\\rm Pt}_{50} Films

  • Author

    Yi Liu ; Sellmyer, David J.

  • Author_Institution
    Dept. of Phys. & Astron., Univ. of Nebraska, Lincoln, NE, USA
  • Volume
    49
  • Issue
    7
  • fYear
    2013
  • fDate
    Jul-13
  • Firstpage
    3292
  • Lastpage
    3294
  • Abstract
    Films of L10-structure Fe50-xCoxPt50 films are synthesized by co-sputtering Fe, Co and Pt on (001) MgO substrates and Si substrates with in-situ heating at 830°C. The nanostructures and magnetic properties of the films are characterized by X-ray diffraction, transmission electron microscopy and SQUID. The compositions of the samples Fe50-xCoxPt50 are designed to maintain an atomic (Fe+Co):Pt ratio of 50:50 while increasing the Co content in each successive sample. In all samples, the X-ray diffraction patterns from samples on MgO substrate exhibit three strong peaks, namely L10Fe50-xCoxPt50 (001), (002) and MgO (002). The X-ray and electron diffraction patterns from untextured samples deposited on Si substrates can be indexed using the L10-structure, being consistent with the result of samples on MgO substrate. Hysteresis-loop measurements show that with increase of the Co concentration from 0 to 15 at%, the saturation magnetization Ms increases from 1017 emu/cm3 to 1165 emu/cm3, the coercivity decreases from 30 kOe to 14 kOe, and anisotropy decreases from 67 Merg/cm3 to 46 Merg/cm3. The nominal maximum energy products are in the range of 39-41 MGOe.
  • Keywords
    X-ray diffraction; cobalt alloys; coercive force; electron diffraction; iron alloys; magnetic anisotropy; magnetic hysteresis; magnetic thin films; nanostructured materials; permanent magnets; platinum alloys; sputter deposition; transmission electron microscopy; Fe50-xCoxPt50; L10-structure film; MgO; SQUID analysis; Si; X-ray diffraction; coercivity; cosputtering; electron diffraction pattern; heating; hysteresis loop measurement; magnetic anisotropy; nanostructure; saturation magnetization; temperature 830 degC; transmission electron microscopy; Magnetic properties; Perpendicular magnetic anisotropy; Saturation magnetization; Silicon; Substrates; X-ray diffraction; Exchange-coupling; magnetic anisotropy; magnetic film; magnetism; permanent magnet;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.2013.2240269
  • Filename
    6559098