Title :
Microbiological fermentation fault diagnosis based on multi-layer support vector machine
Author :
Sun, Zong-hai ; Sun, You-xian
Author_Institution :
Nat. Lab. of Ind. Control Technol., Zhejiang Univ., Hangzhou, China
Abstract :
Microbiological fermentation process is a purebred culture process. Sometimes because of bad operation, some bacteria in the microbiological fermentation process may pollute mycelia. In order to reduce the loss arising by such bacteria, it is very important to diagnose the abnormal states in time. We provide a new method of fault diagnosis, i.e. combination the nonlinear principal component analysis with support vector machines, which may not only extract the main monitor variables from many monitor variables, but also obtain decision function with excellent generalization performance from limited samples of fault. In this paper we provide the algorithm for the method of fault diagnosis. The experiment demonstrates this method is very valid.
Keywords :
fault diagnosis; fermentation; principal component analysis; support vector machines; fault diagnosis; microbiological fermentation process; multilayer support vector machine; mycelia; nonlinear principal component analysis; purebred culture process; Condition monitoring; Eigenvalues and eigenfunctions; Fault diagnosis; Fungi; Laboratories; Microorganisms; Pollution; Principal component analysis; Sun; Support vector machines;
Conference_Titel :
Machine Learning and Cybernetics, 2003 International Conference on
Print_ISBN :
0-7803-8131-9
DOI :
10.1109/ICMLC.2003.1259928