DocumentCode :
402073
Title :
CMOS scaling for sub-90 nm to sub-10 nm
Author :
Iwai, Hiroshi
Author_Institution :
Frontier Collaborative Res. Center, Tokyo Inst. of Technol., Yokohama, Japan
fYear :
2004
fDate :
2004
Firstpage :
30
Lastpage :
35
Abstract :
Recently, CMOS downsizing has been accelerated very aggressively in both production and research level, and even transistor operation of a 6 nm gate length p-channel MOSFET was reported in a conference. However, many serious problems are expected for implementing such small-geometry MOSFETs into large scale integrated circuits, and it is still questionable whether we can successfully introduce sub-10 nm CMOS LSIs into market or not. In this paper, limitation and its possible causes for the downscaling of CMOS towards sub-10 nm are discussed with consideration of past CMOS predictions for the limitation.
Keywords :
CMOS integrated circuits; MOSFET; large scale integration; 10 nm; 6 nm; 90 nm; CMOS LSI; CMOS downscaling; complementary metal oxide semiconductor; large scale integrated circuits; metal oxide semiconductor field effect transistor; p-channel MOSFET; transistor operation; Acceleration; CMOS integrated circuits; CMOS technology; Consumer electronics; Electronic circuits; Humans; Integrated circuit technology; Large scale integration; MOSFET circuits; Production;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Design, 2004. Proceedings. 17th International Conference on
Print_ISBN :
0-7695-2072-3
Type :
conf
DOI :
10.1109/ICVD.2004.1260899
Filename :
1260899
Link To Document :
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