Title :
Program slicing for ATPG-based property checking
Author :
Vedula, Vivekananda M. ; Townsend, Whitney J. ; Abraham, Jacob A.
Author_Institution :
Texas Dev. Center, Intel Corp., Austin, TX, USA
Abstract :
This paper presents a novel technique for abstracting designs in order to increase the efficiency of formal property checking. Bounded Model Checking (BMC), using Satisfiability (SAT) techniques, are beginning to be widely used for checking properties of designs. Recent approaches using sequential ATPG techniques, which harness the structural information of the design, have been shown to perform better than SAT-based BMC. However, these techniques require an effective methodology to deal with the size of commercial designs. A program slicing methodology that has been shown to accelerate sequential ATPG is adapted and integrated into an ATPG-based BMC framework. Furthermore, a generalization of the ATPG-based approach, which checks for unbounded liveness, is also presented.
Keywords :
automatic test pattern generation; computability; program slicing; program verification; sequential circuits; ATPG based property checking; abstracting designs; automatic test pattern generation; bounded model checking; program slicing; satisfiability techniques; sequential ATPG techniques; Acceleration; Automatic test pattern generation; Boolean functions; Contracts; Data structures; Design engineering; Integrated circuit synthesis; Jacobian matrices; Scalability; Testing;
Conference_Titel :
VLSI Design, 2004. Proceedings. 17th International Conference on
Print_ISBN :
0-7695-2072-3
DOI :
10.1109/ICVD.2004.1260983