Title :
Comparison of effectiveness of Current Ratio and Delta-IDDQ tests
Author :
Sabade, Sagar S. ; Walker, D.M.H.
Author_Institution :
Dept. of Comput. Sci., Texas A&M Univ., College Station, TX, USA
Abstract :
IDDQ test is a valuable test method for semiconductor manufacturers. However, its effectiveness is reduced for deep sub-micron technology chips due to rising background leakage. Current two test methods that promise to extend the life of IDDQ test are Current Ratio and Delta-IDDQ. Although several studies have been reported on these methods, their effectiveness in detecting defects has not been contrasted. In this work, we compare these two methods using industrial test data.
Keywords :
leakage currents; semiconductor device testing; current ratio; deep submicron technology; defects detection; delta-IDDQ test; industrial test data; semiconductor manufacturers; Chromium; Circuit faults; Histograms; Large scale integration; Leakage current; Logic testing; Production; Semiconductor device measurement; Sensitivity analysis; Temperature measurement;
Conference_Titel :
VLSI Design, 2004. Proceedings. 17th International Conference on
Print_ISBN :
0-7695-2072-3
DOI :
10.1109/ICVD.2004.1261043
