Title :
Time-domain pulsed large-signal non-linear characterization of microwave transistors
Author :
Charbonniaud, C. ; Teyssier, JP. ; Quéré, R.
Author_Institution :
IRCOM, Limoges Univ., Brive, France
Abstract :
Breaking-up the limitations of VNAs for RF non-linear measurements, the LSNA (large signal network analyser) allows time domain characterizations of full two-port active devices. We demonstrate here some capabilities of the LSNA for pulsed RF signals. We establish a stroboscopic mode based on 3 different sampling techniques. This approach is suitable for repetitive pulsed RF signals.
Keywords :
microwave measurement; microwave transistors; network analysers; semiconductor device measurement; signal sampling; time-domain analysis; LSNA; RF nonlinear measurements; RF waveforms; VNA; large signal network analyser; microwave transistors; pulsed RF signals; repetitive pulsed RF signals; sampling techniques; stroboscopic mode; time domain characterizations; time-domain pulsed large-signal nonlinear characterization; two-port active devices; Calibration; Diodes; Frequency conversion; Frequency domain analysis; Frequency synthesizers; Microwave measurements; Microwave transistors; RF signals; Radio frequency; Time domain analysis;
Conference_Titel :
Microwave Conference, 2003. 33rd European
Print_ISBN :
1-58053-834-7
DOI :
10.1109/EUMC.2003.1262264
