• DocumentCode
    402289
  • Title

    Efficient analysis of printed circuits by the MoM/BI-RME method

  • Author

    Repossi, M. ; Arcioni, P. ; Bozzi, M. ; Bressan, M. ; Perregrini, L.

  • Author_Institution
    Dept. of Electron., Pavia Univ., Italy
  • Volume
    1
  • fYear
    2003
  • fDate
    7-9 Oct. 2003
  • Firstpage
    311
  • Abstract
    This paper presents an efficient technique for the analysis of printed circuits with arbitrarily shaped metallizations. This novel technique is based on the MoM/BI-RME method: it consists in the formulation of an electric field integral equation, which is solved by the Method of Moments (MoM) with entire-domain basis functions. The efficiency of the method derives from the use of the Boundary Integral-Resonant Mode Expansion (BI-RME) method in the determination of the basis functions in the case of fully arbitrary metal patches. The novelty of this work is the formulation of the BI-RME method for the determination of a novel set of basis functions, which enhances the capabilities of a CAD tool previously developed. The BI-RME formulation for calculating entire-domain basis functions with all possible combination of electric/magnetic boundaries is reported.
  • Keywords
    Helmholtz equations; Laplace equations; boundary integral equations; circuit CAD; electric field integral equations; method of moments; microstrip circuits; printed circuit layout; CAD tool; Helmholtz equation; Laplace equation; arbitrarily shaped metallizations; boundary integral-resonant mode expansion; efficient analysis technique; electric field integral equation; entire-domain basis functions; fully arbitrary metal patches; generic microstrip boxed circuits; method of moments; optimized codes; printed circuits; shielded microstrip circuits; Circuit analysis; Current; Integral equations; Laplace equations; Magnetic analysis; Message-oriented middleware; Metallization; Moment methods; Printed circuits; Shape;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Conference, 2003. 33rd European
  • Print_ISBN
    1-58053-834-7
  • Type

    conf

  • DOI
    10.1109/EUMC.2003.1262281
  • Filename
    1262281