DocumentCode :
403279
Title :
Study on the effect of test circuit parameters on dry band arcing failure of ADSS fiber optic cable
Author :
Huang, Qi ; Shi, Baozhuang ; Karady, George G. ; Tuominen, Monty
Author_Institution :
Arizona State Univ., Tempe, AZ, USA
Volume :
1
fYear :
2003
fDate :
13-17 July 2003
Abstract :
The purpose of this paper is to experimentally investigate the effect dry-band arcing caused failure on ADSS (all dielectric self-supporting) caused by different test circuit parameters. It is noted that the circuit parameters have significant effect on the nature of dry-band arcing. In this paper, three different test circuit conditions are applied on the same type of new cable samples. The life data are recorded and analyzed with statistical methods. It is shown that the all-capacitance condition causes less damage to the cable jacket than the resistance or resistance/capacitance conditions. The waveshapes of the arc voltage and arc current are recorded and used to calculate the arc power, arc energy, and arc charge of the different cases. Analysis shows that the failure caused by dry-band arcing is an accumulative process, which is dependent on the arc power, arc duration, arc length, arc energy, arc charge, and power distribution of the arc.
Keywords :
arcs (electric); dielectric properties; optical cables; all dielectric self-supporting; arc charge; arc current wave shapes; arc energy; arc power; arc power distribution; arc voltage wave shapes; cable jacket; dry band arcing failure; fiber optic cable; resistance/capacitance conditions; test circuit parameters; Arc discharges; Automatic testing; Cable shielding; Circuit testing; Dielectrics; Optical fiber cables; Optical fiber testing; Optical fibers; Power cables; Statistical analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power Engineering Society General Meeting, 2003, IEEE
Print_ISBN :
0-7803-7989-6
Type :
conf
DOI :
10.1109/PES.2003.1267169
Filename :
1267169
Link To Document :
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