• DocumentCode
    403422
  • Title

    Analytical approach to SF6 breakdown under transient conditions

  • Author

    Boggs, Steven ; Uchii, Toshiyuki ; Nishiwaki, Susumu

  • Author_Institution
    Dept. of Electr. Eng. & Phys., Connecticut Univ., CT, USA
  • Volume
    3
  • fYear
    2003
  • fDate
    13-17 July 2003
  • Abstract
    Summary form only given. Under many circumstances, the initiation of breakdown can be viewed as conversion of energy stored in the electric field (capacitive energy) to thermal energy, which converts matter in a thin channel from a nonconducting state to a conducting plasma. This paper analyzes this process in the context of breakdown in SF6 as a prelude to a second paper which treats the subject of breakdown under highly inhomogeneous thermal field, quasi-homogeneous electric field conditions.
  • Keywords
    SF6 insulation; electric breakdown; electric fields; gas blast circuit breakers; SF6; SF6 breakdown; breakdown; conducting plasma; electric field; inhomogeneous thermal field; nonconducting state; quasihomogeneous electric field conditions; thermal energy; transient conditions; Computer industry; Dielectric breakdown; Dielectrics and electrical insulation; Electric breakdown; Gas industry; Gas insulation; Physics; Thermal conductivity; Thermal engineering; Transient analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Engineering Society General Meeting, 2003, IEEE
  • Print_ISBN
    0-7803-7989-6
  • Type

    conf

  • DOI
    10.1109/PES.2003.1267462
  • Filename
    1267462
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=403422