DocumentCode
403473
Title
Value-conscious cache: simple technique for reducing cache access power
Author
Chang, Yen-Jen ; Yang, Chia-Lin ; Lai, Feipei
Author_Institution
Dept. of Comput. Sci., Nat. ChungHsing Univ., Taichung, Taiwan
Volume
1
fYear
2004
fDate
16-20 Feb. 2004
Firstpage
16
Abstract
Most microprocessors employ the on-chip caches to bridge the performance gap between the processor and main memory. However, the cache accesses usually contribute significantly to the total power consumption of the chip. Based on the observation that an overwhelming majority of the cache access bits are ´0´, in this paper we propose a value-conscious (VC) cache to reduce the average cache power consumption during an access. Unlike the conventional cache with differential-bitline implementation, the VC cache is a single-bitline design. Depending on the access bit value, the VC cache can dynamically prevent the bitline from being discharged such that the power dissipated in accessing ´0´ is much less than the power dissipated in accessing ´1´. The implementation of the VC cache is a circuit-level technique, which is software independent and orthogonal to other low power techniques at architecture-level. The experimental results based on the SPEC2000 and MediaBench traces show that without compromise of both performance and stability, by exploiting the prevalence of ´0´ bits in access data the VC cache can reduce the average cache read and write power by about 18%∼22% and 36%∼40%, respectively.
Keywords
cache storage; circuit optimisation; low-power electronics; memory architecture; microprocessor chips; MediaBench; SPEC2000; VC; access bit value; access data; architecture-level; average cache power consumption; cache access power reduction; circuit-level technique; low power techniques; single-bitline design; software independent; value-conscious cache; Batteries; Bridge circuits; Capacitance; Circuit stability; Energy consumption; Microprocessors; Pressing; Random access memory; Virtual colonoscopy; Writing;
fLanguage
English
Publisher
ieee
Conference_Titel
Design, Automation and Test in Europe Conference and Exhibition, 2004. Proceedings
ISSN
1530-1591
Print_ISBN
0-7695-2085-5
Type
conf
DOI
10.1109/DATE.2004.1268821
Filename
1268821
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