DocumentCode
403478
Title
Level of similarity: a metric for fault collapsing
Author
Pomeranz, Irith ; Reddy, Sudhakar M.
Author_Institution
Sch. of Electr. & Comput. Eng., Purdue Univ., W. Lafayette, IN, USA
Volume
1
fYear
2004
fDate
16-20 Feb. 2004
Firstpage
56
Abstract
We describe a new approach to fault collapsing that extends fault collapsing based on fault equivalence and fault dominance. The new approach is based on a metric called level of similarity between faults. Informally, a fault fj is said to be similar to a fault fi with a level of similarity SLi,j ≤ 1 if a fraction SLi,j of the tests for fi also detect fj. If SLi,j is high enough, one may exclude fj from the set of target faults and rely on the test for fi (and tests for other faults) to detect fj. We describe a procedure for fault collapsing based on the level of similarity, and study its effectiveness experimentally.
Keywords
automatic test pattern generation; fault simulation; logic testing; fault collapsing; fault dominance; fault equivalence; level of similarity; target faults; Circuit faults; Circuit testing; Cities and towns; Electrical fault detection; Fault detection; Fault diagnosis; Sampling methods;
fLanguage
English
Publisher
ieee
Conference_Titel
Design, Automation and Test in Europe Conference and Exhibition, 2004. Proceedings
ISSN
1530-1591
Print_ISBN
0-7695-2085-5
Type
conf
DOI
10.1109/DATE.2004.1268827
Filename
1268827
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