Title :
Level of similarity: a metric for fault collapsing
Author :
Pomeranz, Irith ; Reddy, Sudhakar M.
Author_Institution :
Sch. of Electr. & Comput. Eng., Purdue Univ., W. Lafayette, IN, USA
Abstract :
We describe a new approach to fault collapsing that extends fault collapsing based on fault equivalence and fault dominance. The new approach is based on a metric called level of similarity between faults. Informally, a fault fj is said to be similar to a fault fi with a level of similarity SLi,j ≤ 1 if a fraction SLi,j of the tests for fi also detect fj. If SLi,j is high enough, one may exclude fj from the set of target faults and rely on the test for fi (and tests for other faults) to detect fj. We describe a procedure for fault collapsing based on the level of similarity, and study its effectiveness experimentally.
Keywords :
automatic test pattern generation; fault simulation; logic testing; fault collapsing; fault dominance; fault equivalence; level of similarity; target faults; Circuit faults; Circuit testing; Cities and towns; Electrical fault detection; Fault detection; Fault diagnosis; Sampling methods;
Conference_Titel :
Design, Automation and Test in Europe Conference and Exhibition, 2004. Proceedings
Print_ISBN :
0-7695-2085-5
DOI :
10.1109/DATE.2004.1268827