Title :
A method for parameter extraction of analogue sine-wave signals for mixed-signal built-in-self-test applications
Author :
Vázquez, Diego ; Leger, Gildas ; Huertas, Gloria ; Rueda, Adoración ; Huertas, José L.
Author_Institution :
Instituto de Microelectron. de Sevilla, Univ. de Sevilla, Spain
Abstract :
This paper presents a method for extracting, in the digital domain, the main characteristic parameters of an analogue sine-wave signal. The required circuitry for on-chip implementation is very simple and robust, which makes the present approach very suitable for BIST applications. Solutions in this sense are addressed together with simulation results that validate the feasibility of the proposed approach.
Keywords :
built-in self test; integrated circuit testing; mixed analogue-digital integrated circuits; BIST applications; analogue sine-wave signals; digital domain; mixed-signal built-in-self-test applications; on-chip implementation; parameter extraction; Built-in self-test; Circuits; Digital modulation; Distortion measurement; Frequency measurement; Parameter extraction; Robustness; Signal generators; Signal processing; System-on-a-chip;
Conference_Titel :
Design, Automation and Test in Europe Conference and Exhibition, 2004. Proceedings
Print_ISBN :
0-7695-2085-5
DOI :
10.1109/DATE.2004.1268864
