DocumentCode
403517
Title
Synchro-tokens: eliminating nondeterminism to enable chip-level test of globally-asynchronous SoC´s
Author
Heath, Matthew W. ; Burleson, Wayne P. ; Harris, Ian G.
Author_Institution
Univ. of Massachusetts Amherst, MA, USA
Volume
1
fYear
2004
fDate
16-20 Feb. 2004
Firstpage
410
Abstract
Globally asynchronous locally synchronous (GALS) clocking applied to a system-on-a-chip (SoC) results in a design in which each core is a synchronous block (SB) of logic with a locally generated clock. Inter-core communication is asynchronous and controlled by wrapper logic around the cores. The nondeterministic synchronization used by most GALS architectures makes chip-level silicon debug and functional test difficult and costly. Deterministic GALS methodologies make dataflow assumptions which are only valid for a very limited set of applications. This paper describes a novel deterministic GALS methodology called "synchro-tokens" whose parameterized wrappers are flexible enough to be useful for a wide range of applications while supporting synchronous debug and test methodologies such as 1149.1 and P1500. The validation of determinism, estimation of area overhead, and analysis of performance impact are detailed.
Keywords
asynchronous circuits; clocks; integrated circuit testing; synchronisation; system-on-chip; GALS architectures; GALS clocking; chip-level silicon; chip-level test; globally-asynchronous SoC; inter-core communication; nondeterminism; synchro-tokens; synchronous block; system-on-a-chip; wrapper logic; Circuits; Clocks; Costs; Frequency synchronization; Logic testing; Metastasis; Sequential analysis; Switches; System testing; System-on-a-chip;
fLanguage
English
Publisher
ieee
Conference_Titel
Design, Automation and Test in Europe Conference and Exhibition, 2004. Proceedings
ISSN
1530-1591
Print_ISBN
0-7695-2085-5
Type
conf
DOI
10.1109/DATE.2004.1268881
Filename
1268881
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