Title :
Exploring logic block granularity for regular fabrics
Author :
Koorapaty, A. ; Kheterpal, V. ; Gopalakrishnan, P. ; Fu, M. ; Pileggi, L.
Author_Institution :
Carnegie Mellon Univ., Pittsburgh, PA, USA
Abstract :
Driven by the economics of design and manufacturing nanoscale integrated circuits, an emphasis is being placed on developing new, regular logic fabrics that leverage the regularity and programmability of FPGAs, yet deliver a level of performance and density close to ASICs. One example of such a fabric is a Via-Patterned Gate Array (VPGA) according to Pillegi et al. (2002), which employs ASIC style global routing on top of an array of patternable logic blocks (PLBs). Previous works (Koorapaty et al., 2003; Koorapaty, 2003; Pileggi et al., 2003) showed that by employing even limited heterogeneity for the VPGA logic blocks, namely combining a 3-LUT with two 3-input Nand gates, one can achieve performance comparable to that provided by standard cells. Since the area cost for such heterogeneity id far less for FPGAs, we can explore new configurations of via-configurable logic blocks that offer greater heterogeneity and granularity to achieve even higher performance. In this paper, we present a new, more granular, via-patterned heterogeneous logic block architecture and compare it to a less granular LUT-based heterogeneous PLB. Our results show higher performance and more effective packing of the logic functions due to increased granularity.
Keywords :
application specific integrated circuits; field programmable gate arrays; logic circuits; logic design; logic gates; 3-LUT; 3-input Nand gates; ASIC; FPGA; VPGA logic blocks; application specific integrated circuits; field programmable gate arrays; logic block granularity; logic functions; nanoscale integrated circuits; patternable logic blocks; regular logic fabrics; via-configurable logic blocks; via-patterned gate array; Application specific integrated circuits; Costs; Fabrics; Field programmable gate arrays; Integrated circuit manufacture; Logic arrays; Logic circuits; Logic design; Programmable logic arrays; Routing;
Conference_Titel :
Design, Automation and Test in Europe Conference and Exhibition, 2004. Proceedings
Print_ISBN :
0-7695-2085-5
DOI :
10.1109/DATE.2004.1268890