DocumentCode :
403529
Title :
Overhead-conscious voltage selection for dynamic and leakage energy reduction of time-constrained systems
Author :
Andrei, Alexandru ; Schmitz, Marcus ; Eles, Petru ; Peng, Zebo ; Al-Hashimi, Bashir M.
Author_Institution :
Dept. of Comput. & Inf. Sci., Linkoping Univ., Sweden
Volume :
1
fYear :
2004
fDate :
16-20 Feb. 2004
Firstpage :
518
Abstract :
Dynamic voltage scaling and adaptive body biasing have been shown to reduce dynamic and leakage power consumption effectively. In this paper, we optimally solve the combined supply voltage and body bias selection problem for multi-processor systems with imposed time constraints, explicitly taking into account the transition overheads implied by changing voltage levels. Both energy and time overheads are considered. We investigate the continuous voltage scaling as well as its discrete counterpart, and we prove NP-hardness in the discrete case. Furthermore, the continuous voltage scaling problem is formulated and solved using nonlinear programming with polynomial time complexity, while for the discrete problem we use mixed integer linear programming. Extensive experiments, conducted on several benchmarks and a real-life example, are used to validate the approaches.
Keywords :
CMOS integrated circuits; integer programming; integrated circuit design; integrated circuit modelling; low-power electronics; nonlinear programming; power consumption; NP-hardness; adaptive body biasing; body bias selection; circuit supply voltage; discrete problem; dynamic energy reduction; dynamic power consumption; dynamic voltage scaling; leakage energy reduction; leakage power; mixed integer linear programming; multiprocessor systems; nonlinear programming; overhead-conscious voltage selection; polynomial time complexity; threshold voltage; time-constrained systems; transition overheads; voltage levels; CMOS technology; Dynamic voltage scaling; Energy consumption; Frequency; Information science; Integer linear programming; Polynomials; Runtime; Threshold voltage; Voltage control;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Automation and Test in Europe Conference and Exhibition, 2004. Proceedings
ISSN :
1530-1591
Print_ISBN :
0-7695-2085-5
Type :
conf
DOI :
10.1109/DATE.2004.1268898
Filename :
1268898
Link To Document :
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