DocumentCode :
403535
Title :
Stimuli generation with late binding of values
Author :
Ziv, Avi
Author_Institution :
IBM Res. Lab., Haifa, Israel
Volume :
1
fYear :
2004
fDate :
16-20 Feb. 2004
Firstpage :
558
Abstract :
Generating test-cases that reach corner cases in the design is one of the main challenges in the functional verification of complex designs. In this paper, we describe a new technique that increases the ability of test generators by delaying assignment of values in the generated stimuli, until these values are used in the design. This late-binding allows the generator to have a more accurate view of the state of the design, and thus it can better choose the correct values. Experimental results show that late-binding can significantly improve coverage, with a reasonable penalty in simulation time.
Keywords :
automatic test pattern generation; circuit simulation; digital simulation; formal verification; hardware-software codesign; dynamic generation; functional verification; hardware design cycle; late value binding; simulation time; stimuli generation; test generators; test-cases generation; Circuit simulation; Computational modeling; Costs; Delay; Event detection; Hardware; Investments; Laboratories; Pipelines; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Automation and Test in Europe Conference and Exhibition, 2004. Proceedings
ISSN :
1530-1591
Print_ISBN :
0-7695-2085-5
Type :
conf
DOI :
10.1109/DATE.2004.1268904
Filename :
1268904
Link To Document :
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