Title :
Functional coverage metric generation from temporal event relation graph
Author :
Kwon, Young-Su ; Kyung, Chong-Min
Author_Institution :
Lab. of VLSI Syst., Korea Adv. Inst. of Sci. & Technol., Taejon, South Korea
Abstract :
Functional coverage is a technique which can be used for checking the completeness of test vectors. In this paper, automatic generation of temporal events for functional coverage is proposed. The TERG (Temporal Event Relation Graph) is the graph where the nodes represent basic temporal property and the edges represent the time-shift value between two properties. Hierarchical temporal events are generated by traversing TERG such that invalid or irrelevant properties are eliminated. Concurrent edge groups in TERG make it possible to generate more comprehensive temporal properties.
Keywords :
automatic test pattern generation; formal verification; graph theory; temporal logic; TERG; concurrent edge groups; functional coverage; hierarchical temporal events; metric generation; temporal event relation graph; temporal property; test vector completeness checking; time-shift value; Automatic testing; Boolean functions; Character generation; Design automation; Europe; Formal verification; Monitoring; Specification languages; Time measurement; Very large scale integration;
Conference_Titel :
Design, Automation and Test in Europe Conference and Exhibition, 2004. Proceedings
Print_ISBN :
0-7695-2085-5
DOI :
10.1109/DATE.2004.1268923
