DocumentCode :
403567
Title :
Test compression and hardware decompression for scan-based SoCs
Author :
Wolff, Francis G. ; Papachristou, Chris ; McIntyre, David R.
Author_Institution :
Electr. Eng. & Comput. Sci., Case Western Reserve Univ., Cleveland, OH, USA
Volume :
1
fYear :
2004
fDate :
16-20 Feb. 2004
Firstpage :
716
Abstract :
We present a new decompression architecture suitable for embedded cores in SoCs which focuses on improving the download time by avoiding higher internal-to-ATE clock ratios and by exploiting hardware parallelism. The bounded Huffman compression facilitates decompression hardware tradeoffs. Our technique is scalable in that the downloadable RAM-based decode table and accommodates for different SoC cores with different characteristics such as the number of scan chains and test set data distributions.
Keywords :
Huffman codes; data compression; integrated circuit testing; logic testing; system-on-chip; RAM-based decode table; bounded Huffman compression; decompression architecture; decompression hardware tradeoffs; download time reduction; embedded cores; hardware decompression; hardware parallelism; internal-to-ATE clock ratios; scan chains; scan-based SoC; test compression; test set data distributions; Automatic test pattern generation; Clocks; Computer science; Decoding; Feeds; Hardware; Parallel processing; Pins; Tellurium; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Automation and Test in Europe Conference and Exhibition, 2004. Proceedings
ISSN :
1530-1591
Print_ISBN :
0-7695-2085-5
Type :
conf
DOI :
10.1109/DATE.2004.1268945
Filename :
1268945
Link To Document :
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