Title :
Concurrent sizing, Vdd and Vth assignment for low-power design
Author :
Srivastava, Ashish ; Sylvester, Dennis ; Blaauw, David
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Michigan Univ., Ann Arbor, MI, USA
Abstract :
We present a sensitivity-based algorithm for total power including dynamic and subthreshold leakage power minimization using simultaneous sizing, Vdd and Vth assignment. The proposed algorithm is implemented and tested on a set of combinational benchmark circuits. A comparison with traditional CVS based algorithms demonstrates the advantage of the algorithm including an average power reduction of 37% at primary input activities of 0.1. We also investigate the impact of various low Vdd values on total power savings.
Keywords :
benchmark testing; leakage currents; low-power electronics; minimisation; power supply circuits; sensitivity analysis; CVS-based algorithms; Vdd assignment; Vth assignment; combinational benchmark circuits; concurrent sizing; dynamic leakage; low-power design; power minimization; power reduction; sensitivity-based algorithm; subthreshold leakage; Algorithm design and analysis; Automatic testing; Circuit testing; Delay; Design automation; Europe; Power dissipation; Signal restoration; Switching circuits; Timing;
Conference_Titel :
Design, Automation and Test in Europe Conference and Exhibition, 2004. Proceedings
Print_ISBN :
0-7695-2085-5
DOI :
10.1109/DATE.2004.1268946