• DocumentCode
    403631
  • Title

    A new approach to timing analysis using event propagation and temporal logic

  • Author

    Mondal, Arijit ; Chakrabarti, Partha P. ; Mandal, C.R.

  • Author_Institution
    Dept. of Comput. Sci. & Eng., Indian Inst. of Technol., Kharagpur, India
  • Volume
    2
  • fYear
    2004
  • fDate
    16-20 Feb. 2004
  • Firstpage
    1198
  • Abstract
    Present day designers require deep reasoning methods to analyze circuit timing. This includes analysis of effects of dynamic behavior (like glitches) on critical paths, simultaneous switching and identification of specific patterns and their timings. This paper proposes a novel approach that uses a combination of symbolic event propagation and temporal reasoning to extract timing properties of gate-level circuits. The formulation captures complex situations like triggering of traditional false paths and simultaneous switching in a unified symbolic representation in addition to identifying false paths, critical paths as well as conditions for such situations. This information is then represented as an event-time graph. A simple temporal logic on events is proposed that can be used to formulate a wide class of useful queries for various input scenarios. These include maximum/minimum delays, transition times, duration of patterns, etc. An algorithm is developed that retrieves answers to such queries from the event-time graph. A complete BDD based implementation of this system has been made. Results on the ISCAS85 benchmarks indicate very interesting properties of these circuits.
  • Keywords
    binary decision diagrams; delays; logic gates; network analysis; temporal logic; temporal reasoning; timing circuits; BDD; binary decision diagram; circuit timing analysis; critical path identification; event time graph; false path identification; false path trigger=ring; gate level circuits; maximum delays; minimum delays; pattern identification; symbolic event propagation; temporal logic; temporal reasoning; transition times; Binary decision diagrams; Circuit analysis; Circuit simulation; Data mining; Delay estimation; Logic; Pattern analysis; Propagation delay; Timing; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation and Test in Europe Conference and Exhibition, 2004. Proceedings
  • ISSN
    1530-1591
  • Print_ISBN
    0-7695-2085-5
  • Type

    conf

  • DOI
    10.1109/DATE.2004.1269055
  • Filename
    1269055