Title :
EEPROM memory: threshold voltage built in self diagnosis
Author :
Portal, J.M. ; Aziza, H. ; Née, D.
Author_Institution :
ST-Microelectronics
fDate :
Sept. 30-Oct. 2, 2003
Keywords :
Circuit testing; Data mining; EPROM; Fabrication; Feature extraction; Nonvolatile memory; Portals; Smart cards; Threshold voltage; Tunneling;
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
Print_ISBN :
0-7803-8106-8
DOI :
10.1109/TEST.2003.1270821
