Title :
Fault pattern oriented defect diagnosis for memories
Author :
Wang, Chih-Wea ; Cheng, Kuo-Liang ; Lee, Jih-Nung ; Chou, Yung-Fa ; Huang, Chih-Tsun ; Wu, Cheng-Wen
Author_Institution :
National Tsing Hua University
fDate :
Sept. 30-Oct. 2, 2003
Keywords :
Analytical models; Automation; Circuit analysis; Circuit faults; Circuit simulation; Circuit testing; Failure analysis; Fault diagnosis; Random access memory; System-on-a-chip;
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
Print_ISBN :
0-7803-8106-8
DOI :
10.1109/TEST.2003.1270822
