DocumentCode
403787
Title
Fault pattern oriented defect diagnosis for memories
Author
Wang, Chih-Wea ; Cheng, Kuo-Liang ; Lee, Jih-Nung ; Chou, Yung-Fa ; Huang, Chih-Tsun ; Wu, Cheng-Wen
Author_Institution
National Tsing Hua University
Volume
1
fYear
2003
fDate
Sept. 30-Oct. 2, 2003
Firstpage
29
Lastpage
38
Keywords
Analytical models; Automation; Circuit analysis; Circuit faults; Circuit simulation; Circuit testing; Failure analysis; Fault diagnosis; Random access memory; System-on-a-chip;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2003. Proceedings. ITC 2003. International
ISSN
1089-3539
Print_ISBN
0-7803-8106-8
Type
conf
DOI
10.1109/TEST.2003.1270822
Filename
1270822
Link To Document