Title :
Periodic jitter injection with direct time synthesis by SPPtm ATE for serdes jitter tolerance test in production
Author :
Shitnanouchi, M.
Author_Institution :
NPTest, a Schlumberger Company
fDate :
Sept. 30-Oct. 2, 2003
Keywords :
Circuit testing; Costs; Delay; Frequency; Instruments; Jitter; Logic testing; Production systems; Protocols; System testing;
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
Print_ISBN :
0-7803-8106-8
DOI :
10.1109/TEST.2003.1270824
