Title :
Effects of deterministic jitter in a cable on jitter tolerance measurements
Author :
Yamaguchi, Takahiro J. ; Soma, Mani ; Ishida, Masahiro ; Kurosawa, Makoto ; Musha, Hirobumi
Author_Institution :
University of Washington
fDate :
Sept. 30-Oct. 2, 2003
Keywords :
Bit error rate; Cables; Circuit testing; Frequency; Instruments; Integrated circuit interconnections; Local area networks; System testing; Timing jitter; Uncertainty;
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
Print_ISBN :
0-7803-8106-8
DOI :
10.1109/TEST.2003.1270825
