مرکز منطقه ای اطلاع رساني علوم و فناوري - Cmos built-in test architecture for high-speed jitter measurement

DocumentCode :

403791

Title :

Cmos built-in test architecture for high-speed jitter measurement

Author :

Lin, Henry C. ; Taylor, Karen ; Chong, Alan ; Chan, Eddie ; Soma, Mani ; Haggag, Hosam ; Huard, Jeff ; Braat, J.

Author_Institution :

University of Washington

Volume :

fYear :

2003

fDate :

Sept. 30-Oct. 2, 2003

Firstpage :

Lastpage :

Keywords :

Built-in self-test; Clocks; Costs; Delay; Jitter; Noise measurement; Phase measurement; Semiconductor device measurement; Testing; Voltage;

fLanguage :

English

Publisher :

ieee

Conference_Titel :

Test Conference, 2003. Proceedings. ITC 2003. International

ISSN :

1089-3539

Print_ISBN :

0-7803-8106-8

Type :

conf

DOI :

10.1109/TEST.2003.1270826

Filename :

1270826

Link To Document :