Title :
Relating yield models to burn-in fall-out in time
Author :
Barnett, Thomas S. ; Singh, Adit D.
Author_Institution :
Auburn University
fDate :
Sept. 30-Oct. 2, 2003
Keywords :
Costs; Electronic equipment testing; Life testing; Logic testing; Maintenance; Microelectronics; Ovens; Probes; Semiconductor device modeling; Stress;
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
Print_ISBN :
0-7803-8106-8
DOI :
10.1109/TEST.2003.1270827
