DocumentCode

403792

Title

Relating yield models to burn-in fall-out in time

Author

Barnett, Thomas S. ; Singh, Adit D.

Author_Institution

Auburn University

Volume

1

fYear

2003

fDate

Sept. 30-Oct. 2, 2003

Firstpage

77

Lastpage

84

Keywords

Costs; Electronic equipment testing; Life testing; Logic testing; Maintenance; Microelectronics; Ovens; Probes; Semiconductor device modeling; Stress;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 2003. Proceedings. ITC 2003. International

ISSN

1089-3539

Print_ISBN

0-7803-8106-8

Type

conf

DOI

10.1109/TEST.2003.1270827

Filename

1270827