DocumentCode :
403793
Title :
Testing DSM asic with static, δIDDQ, and dynamic test suite: implementation and results
Author :
Nishizaki, Yoshihito ; Nakayama, Osamu ; Matsumoto, Chiaki ; Kimura, Yoshitaka ; Kobayashi, Toshimi ; Nakamura, Hiroyuki
Author_Institution :
Kawasaki Microelectronics, Inc.
Volume :
1
fYear :
2003
fDate :
Sept. 30-Oct. 2, 2003
Firstpage :
85
Lastpage :
94
Keywords :
Application specific integrated circuits; Automatic test pattern generation; Automatic testing; Built-in self-test; Delay effects; Frequency; Logic testing; Microelectronics; Test pattern generators; Vehicle dynamics;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
ISSN :
1089-3539
Print_ISBN :
0-7803-8106-8
Type :
conf
DOI :
10.1109/TEST.2003.1270828
Filename :
1270828
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=403793
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