• DocumentCode
    403793
  • Title

    Testing DSM asic with static, δIDDQ, and dynamic test suite: implementation and results

  • Author

    Nishizaki, Yoshihito ; Nakayama, Osamu ; Matsumoto, Chiaki ; Kimura, Yoshitaka ; Kobayashi, Toshimi ; Nakamura, Hiroyuki

  • Author_Institution
    Kawasaki Microelectronics, Inc.
  • Volume
    1
  • fYear
    2003
  • fDate
    Sept. 30-Oct. 2, 2003
  • Firstpage
    85
  • Lastpage
    94
  • Keywords
    Application specific integrated circuits; Automatic test pattern generation; Automatic testing; Built-in self-test; Delay effects; Frequency; Logic testing; Microelectronics; Test pattern generators; Vehicle dynamics;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2003. Proceedings. ITC 2003. International
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-8106-8
  • Type

    conf

  • DOI
    10.1109/TEST.2003.1270828
  • Filename
    1270828
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=403793