403795

Hyac: a hybrid structural sat based atpg for crosstalk

Bai, Xiaoliang ; Dey, Sujit ; Krstid, A.

University of California

1

2003

Sept. 30-Oct. 2, 2003

112

121

Automatic logic units; Automatic test pattern generation; Capacitance; Circuit simulation; Circuit testing; Crosstalk; Delay effects; Integrated circuit interconnections; Integrated circuit noise; Manufacturing;

English

ieee

Test Conference, 2003. Proceedings. ITC 2003. International

1089-3539

0-7803-8106-8

conf

10.1109/TEST.2003.1270831

1270831