Title :
Path delay test generation for domino logic circuits in the presence of crosstalk
Author :
Kundu, Rahul ; Blanton, R.D.
Author_Institution :
Carnegie Mellon University
fDate :
Sept. 30-Oct. 2, 2003
Keywords :
Circuit testing; Crosstalk; Delay effects; Hazards; Iterative algorithms; Logic circuits; Logic testing; Semiconductor device testing; Silicon; Timing;
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
Print_ISBN :
0-7803-8106-8
DOI :
10.1109/TEST.2003.1270832
